P_1x5L_104

P_1x5L_104_A

Production testing

Date:2/16/2007

Operator: Isaac Childres

start testing time:1:08 PM

Sensor: S_1x5L_10, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W33_XC4K5LT 57B

ROC1 W33_XC4K5LT 57A

ROC2 W33_XC4K5LT 56C

ROC3 W33_XC4K5LT 56A

ROC4 W33_XC4K5LT 55D

ROC	ROC wafer	Label
ROC0	W33_XC4K5LT	57B
ROC1	W33_XC4K5LT	57A
ROC2	W33_XC4K5LT	56C
ROC3	W33_XC4K5LT	56A
ROC4	W33_XC4K5LT	55D

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 132 140 140 142 140

Vana, VanaData 131 141 140 113 127

CalDelData and plots 99 82 82 76 83

VthrCompData and plots 79 72 84 68 71

TestDdata ,TestD Plots 0 0 0 3 0

LightData ,Light Plots 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	110	90	120	120	145
Vsf	140	145	140	135	140
VoffsetOp	80	110	85	65	70
VIbias_PH	105	100	100	105	100

ROC0 NOISE			MEAN = 5.125005 SIGMA = 0.393445
ROC1 NOISE			MEAN = 3.942141 SIGMA = 0.302379
ROC2 NOISE			MEAN = 4.455362 SIGMA = 0.335023
ROC3 NOISE			MEAN = 5.290886 SIGMA = 0.422880
ROC4 NOISE			MEAN = 4.827355 SIGMA = 0.401705

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 1:26 PM

Ibias_DAC, Ibias_DAC Data	132	140	140	142	140
Vana, VanaData	131	141	140	113	127
CalDelData and plots	99	82	82	76	83
VthrCompData and plots	79	72	84	68	71
TestDdata ,TestD Plots	0	0	0	3	0
LightData ,Light Plots	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD