P_1x5L_102

P_1x5L_102_A

Production testing

Date:2/21/2007

Operator: Isaac Childres

start testing time:3:55 PM

Sensor: S_1x5L_10, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W29_X64K5ST 49B

ROC1 W29_X64K5ST 48D

ROC2 W29_X64K5ST 48C

ROC3 W29_X64K5ST 48B

ROC4 W29_X64K5ST 47D

ROC	ROC wafer	Label
ROC0	W29_X64K5ST	49B
ROC1	W29_X64K5ST	48D
ROC2	W29_X64K5ST	48C
ROC3	W29_X64K5ST	48B
ROC4	W29_X64K5ST	47D

Depletion Voltage is -44 and suggested operational voltage is -84

Ibias_DAC, Ibias_DAC Data 144 134 128 132 138

Vana, VanaData 127 138 134 138 129

CalDelData and plots 78 100 92 79 82

VthrCompData and plots 70 78 75 80 67

TestDdata ,TestD Plots 0 0 0 0 0

LightData ,Light Plots 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	120	120	115	105	120
Vsf	140	140	140	140	140
VoffsetOp	85	70	60	105	85
VIbias_PH	95	100	100	105	95

ROC0 NOISE			MEAN = 4.618261 SIGMA = 0.365026
ROC1 NOISE			MEAN = 5.619138 SIGMA = 0.420874
ROC2 NOISE			MEAN = 4.988235 SIGMA = 0.399930
ROC3 NOISE			MEAN = 5.215851 SIGMA = 0.407914
ROC4 NOISE			MEAN = 4.799420 SIGMA = 0.387151

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 4:14 PM

Ibias_DAC, Ibias_DAC Data	144	134	128	132	138
Vana, VanaData	127	138	134	138	129
CalDelData and plots	78	100	92	79	82
VthrCompData and plots	70	78	75	80	67
TestDdata ,TestD Plots	0	0	0	0	0
LightData ,Light Plots	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD