P_1x5L_097_C

Production testing

Date:6/27/2007

Operator: Emily Grace

start testing time:11:06 AM

Sensor: S_1x5L_09, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KZNG1JT05A
ROC1KZNG1JT15B
ROC2KZNG1JT15A
ROC3KZNG1JT55B
ROC4KZNG1JT65D

Depletion Voltage is -40 and suggested operational voltage is -80
Ibias_DAC, Ibias_DAC Data 150 144 166 144 158
Vana, VanaData 144 131 156 137 140
CalDelData and plots6478776277
VthrCompData and plots7977908274
TestDdata ,TestD Plots140002
LightData ,Light Plots350005
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe951108511095
Vsf145140155140140
VoffsetOp75751058065
VIbias_PH105105100100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.601576

SIGMA = 0.363502
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.835759

SIGMA = 0.373631
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 3.839722

SIGMA = 0.305841
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.692501

SIGMA = 0.385206
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.753000

SIGMA = 0.368950

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:32 AM