P_1x5L_073

P_1x5L_073_A

Production testing

Date:6/18/2007

Operator: Emily Grace

start testing time:11:42 AM

Sensor: S_1x5L_07, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W45_D3LQFLT 52C

ROC1 W45_D3LQFLT 52A

ROC2 W45_D3LQFLT 68C

ROC3 W45_D3LQFLT 67C

ROC4 W45_D3LQFLT 67B

ROC	ROC wafer	Label
ROC0	W45_D3LQFLT	52C
ROC1	W45_D3LQFLT	52A
ROC2	W45_D3LQFLT	68C
ROC3	W45_D3LQFLT	67C
ROC4	W45_D3LQFLT	67B

Depletion Voltage is -48 and suggested operational voltage is -88

Ibias_DAC, Ibias_DAC Data 150 158 146 154 148

Vana, VanaData 148 149 124 132 132

CalDelData and plots 95 77 102 94 100

VthrCompData and plots 83 88 75 82 76

TestDdata ,TestD Plots 16 3 12 0 2

LightData ,Light Plots 0 0 0 0 1

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	100	85	120	100	110
Vsf	150	155	140	140	140
VoffsetOp	100	105	80	90	95
VIbias_PH	100	95	95	100	105

ROC0 NOISE			MEAN = 4.153912 SIGMA = 0.315703
ROC1 NOISE			MEAN = 3.885183 SIGMA = 0.304774
ROC2 NOISE			MEAN = 4.222444 SIGMA = 0.343422
ROC3 NOISE			MEAN = 4.305974 SIGMA = 0.359089
ROC4 NOISE			MEAN = 4.327937 SIGMA = 0.343549

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:08 PM

Ibias_DAC, Ibias_DAC Data	150	158	146	154	148
Vana, VanaData	148	149	124	132	132
CalDelData and plots	95	77	102	94	100
VthrCompData and plots	83	88	75	82	76
TestDdata ,TestD Plots	16	3	12	0	2
LightData ,Light Plots	0	0	0	0	1
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD