P_1x5L_052_C

Production testing

Date:6/25/2007

Operator: Emily Grace

start testing time:11:29 AM

Sensor: S_1x5L_05, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0KZNG1JT13B
ROC1KZNG1JT73A
ROC2KZNG1JT42D
ROC3KZNG1JT33C
ROC4KZNG1JT53B

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 170 142 156 156 150
Vana, VanaData 143 133 150 121 151
CalDelData and plots7097788274
VthrCompData and plots8878907289
TestDdata ,TestD Plots42001
LightData ,Light Plots830018
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe10511095140100
Vsf145135150135145
VoffsetOp110651006575
VIbias_PH10010010095100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 3.641503

SIGMA = 0.285427
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.676822

SIGMA = 0.373190
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.165688

SIGMA = 0.361732
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.520429

SIGMA = 0.349824
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.719027

SIGMA = 0.368975

Comment (if any):

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 11:54 AM