P_1x5L_047

P_1x5L_047_C

Production testing

Date:2/28/2007

Operator: Isaac Childres

start testing time:12:40 PM

Sensor: S_1x5L_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 XG4KFCT 55C

ROC1 XG4KFCT 54D

ROC2 XG4KFCT 53D

ROC3 XG4KFCT 53C

ROC4 XG4KFCT 52D

ROC	ROC wafer	Label
ROC0	XG4KFCT	55C
ROC1	XG4KFCT	54D
ROC2	XG4KFCT	53D
ROC3	XG4KFCT	53C
ROC4	XG4KFCT	52D

Depletion Voltage is -46 and suggested operational voltage is -86

Ibias_DAC, Ibias_DAC Data 142 128 136 144 130

Vana, VanaData 130 124 139 127 121

CalDelData and plots 89 84 84 79 88

VthrCompData and plots 73 71 82 71 81

TestDdata ,TestD Plots 0 0 0 0 0

LightData ,Light Plots 1 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD

Noise MAP

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	135	140	100	115	150
Vsf	140	135	140	135	140
VoffsetOp	70	55	75	70	65
VIbias_PH	105	105	100	95	100

ROC0 NOISE			MEAN = 5.186081 SIGMA = 0.422677
ROC1 NOISE			MEAN = 5.519051 SIGMA = 0.424436
ROC2 NOISE			MEAN = 4.570097 SIGMA = 0.361504
ROC3 NOISE			MEAN = 4.444230 SIGMA = 0.348911
ROC4 NOISE			MEAN = 5.669005 SIGMA = 0.446289

Comment (if any): Good.

This Device have been tested 0Times prior to this one and here are the links to the previous tests:

End testing time: 12:58 PM

Ibias_DAC, Ibias_DAC Data	142	128	136	144	130
Vana, VanaData	130	124	139	127	121
CalDelData and plots	89	84	84	79	88
VthrCompData and plots	73	71	82	71	81
TestDdata ,TestD Plots	0	0	0	0	0
LightData ,Light Plots	1	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD