P_1x2R_014_C-1

Production testing

Date:2/9/2007

Operator: Isaac Childres

start testing time:12:08 PM

Sensor: S_1x2R_01, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XE4K3KT35C
ROC1XE4K3KT33C

FIXED (not measured) Depletion Voltage is -50 and FIXED (not measured) suggested operational voltage is -150
Ibias_DAC, Ibias_DAC Data 132 142
Vana, VanaData 122 125
TestDdata ,TestD Plots20
LightData ,Light Plots00
Pass/Fail TestD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.232646

SIGMA = 0.321137
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.244336

SIGMA = 0.327687

Comment (if any): Good.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_1x2R_014_C.html,

End testing time: 12:19 PM