P_1x2L_116_A-1

Production testing

Date:3/7/2007

Operator: Isaac Childres

start testing time:1:10 PM

Sensor: S_1x2L_11, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W34_XA4K3PT26D
ROC1W34_XA4K3PT26C

Depletion Voltage is -46 and suggested operational voltage is -86
Ibias_DAC, Ibias_DAC Data 146 144
Vana, VanaData 138 123
CalDelData and plots7772
VthrCompData and plots7487
TestDdata ,TestD Plots00
LightData ,Light Plots00
Pass/Fail TestD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe110130
Vsf140140
VoffsetOp9590
VIbias_PH100100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.395103

SIGMA = 0.352835
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.967258

SIGMA = 0.385038

Comment (if any): Good.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_1x2L_116_A.html,

End testing time: 1:27 PM