Sensor: S_1x2L_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | W36_XD4K3LT | 03D |
| ROC1 | W36_XD4K3LT | 03C |
| Ibias_DAC, Ibias_DAC Data | 154 | 146 |
| Vana, VanaData | 142 | 131 |
| CalDelData and plots | 85 | 91 |
| VthrCompData and plots | 88 | 69 | Depletion Voltage is -44 and suggested operational voltage is -84
| TestDdata ,TestD Plots | 1 | 0 |
| LightData ,Light Plots | 0 | 0 |
| Pass/Fail TestD | GOOD | GOOD |
| Pass/Fail LIGHT | GOOD | GOOD |
Noise MAP at VMAX
![[IMAGE] of](P_1x2L_046_A-580-noise.jpg)
Efficiency MAP
![[IMAGE] of](P_1x2L_046_A-580-efficiency.jpg)
EXTRA DACs for NOISE
| VHldDe | 90 | 115 |
| Vsf | 140 | 135 |
| VoffsetOp | 85 | 65 |
| VIbias_PH | 105 | 100 |
| ROC0 NOISE | ![[IMAGE] of](P_1x2L_046_A-580-noise-ROC0-MAP.jpg) | ![[IMAGE] of](P_1x2L_046_A-580-noise-ROC0-HISTO.jpg) | MEAN = 4.388622SIGMA = 0.335300 |
| ROC1 NOISE | ![[IMAGE] of](P_1x2L_046_A-580-noise-ROC1-MAP.jpg) | ![[IMAGE] of](P_1x2L_046_A-580-noise-ROC1-HISTO.jpg) | MEAN = 4.519456SIGMA = 0.368455 |
Comment (if any):
This Device have been tested 0Times prior to this one and here are the links to the previous tests:End testing time: 3:10 PM