RECEIVED by Bolla Gino on date 2007-03-16 From IZM
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | W36_XD4K3LT | 37D |
| ROC1 | W36_XD4K3LT | 37C |
| ROC2 | W36_XD4K3LT | 37B |
| ROC3 | W36_XD4K3LT | 54D |
| ROC4 | W36_XD4K3LT | 55A |
| ROC5 | W36_XD4K3LT | 55B |
Inspected by Clampitt Joseph on date 3/20/2007
IV Measured by Clampitt Joseph on date 3/20/2007
![]() | IV XML File |
DEVICE scratched during removal from probe statio, to be reinspected and IVed again.
Inspected by Clampitt Joseph on date 3/20/2007
| Picture | Comment |
|---|---|
![]() | Scratches induced while removing the device from the probe station. |
IV Measured by Clampitt Joseph on date 3/20/2007
![]() | IV XML File |