RECEIVED by Bolla Gino on date 2007-03-16 From IZM
ROC | ROC wafer | Label |
---|---|---|
ROC0 | W36_XD4K3LT | 37D |
ROC1 | W36_XD4K3LT | 37C |
ROC2 | W36_XD4K3LT | 37B |
ROC3 | W36_XD4K3LT | 54D |
ROC4 | W36_XD4K3LT | 55A |
ROC5 | W36_XD4K3LT | 55B |
Inspected by Clampitt Joseph on date 3/20/2007
IV Measured by Clampitt Joseph on date 3/20/2007
IV XML File |
DEVICE scratched during removal from probe statio, to be reinspected and IVed again.
Inspected by Clampitt Joseph on date 3/20/2007
Picture | Comment |
---|---|
Scratches induced while removing the device from the probe station. |
IV Measured by Clampitt Joseph on date 3/20/2007
IV XML File |