RECEIVED by McKinney Cameron on date 12/7/2006 From IZM
ROC | ROC wafer | Label |
---|---|---|
ROC0 | XF4K3JT | 20B |
ROC1 | XF4K3JT | 20A |
Inspected by McKinney Cameron on date 12/7/2006
Inspected by McKinney Cameron on date 12/8/2006
Picture | Comment |
---|---|
Scratch in the lower-left corner of ROC0 | |
General residue along the left side of ROC0 |
IV Measured by McKinney Cameron on date 12/8/2006
IV XML File |