RECEIVED by McKinney Cameron on date 12/7/2006 From IZM
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | XF4K3JT | 20B |
| ROC1 | XF4K3JT | 20A |
Inspected by McKinney Cameron on date 12/7/2006
Inspected by McKinney Cameron on date 12/8/2006
| Picture | Comment |
|---|---|
![]() | Scratch in the lower-left corner of ROC0 |
![]() | General residue along the left side of ROC0 |
IV Measured by McKinney Cameron on date 12/8/2006
![]() | IV XML File |