RECEIVED by McKinney Cameron on date 1/26/2007 From RTI
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | XE4K3KT | 57D |
| ROC1 | XE4K3KT | 58C |
| ROC2 | XE4K3KT | 58D |
| ROC3 | XE4K3KT | 51A |
| ROC4 | XE4K3KT | 53B |
| ROC5 | XE4K3KT | 57A |
| ROC6 | XE4K3KT | 57B |
| ROC7 | XE4K3KT | 64C |
| ROC8 | XE4K3KT | 54B |
| ROC9 | XE4K3KT | 54A |
Inspected by McKinney Cameron on date 1/26/2007
| Picture | Comment |
|---|---|
![]() | Scratch on left side of ROC0 |
![]() | Large splotch in the middle of ROC3 |
![]() | Smuck on the left side of ROC6 |
![]() | Dirt in the middle of ROC7 |
IV Measured by McKinney Cameron on date 1/26/2007
![]() | IV XML File |