RECEIVED by McKinney Cameron on date 1/26/2007 From RTI
| ROC | ROC wafer | Label |
|---|---|---|
| ROC0 | XE4K3KT | 57C |
| ROC1 | XE4K3KT | 56D |
| ROC2 | XE4K3KT | 55D |
| ROC3 | XE4K3KT | 54D |
| ROC4 | XE4K3KT | 53A |
| ROC5 | XE4K3KT | 52B |
| ROC6 | XE4K3KT | 52A |
| ROC7 | XE4K3KT | 51B |
Inspected by McKinney Cameron on date 1/26/2007
| Picture | Comment |
|---|---|
![]() | Splotch near the center of ROC5 |
![]() | Scratch in the middle of ROC7 |
IV Measured by McKinney Cameron on date 1/26/2007
![]() | IV XML File |