Advanced X-ray Scattering Techniques for Nanostructures and Surface Dynamics
Friday April 03, 2009
PHYS 203
Hyunjung Kim
Department of Physics & nterdisciplinary Program of Integrated Biotechnology, Sogang University, Seoul, Korea
New generation of synchrotron sources have opened many new avenues of
research with x-ray beams, several orders of magnitude brighter than
those available previously. I will describe the use of coherent X-ray
beams, e.g., X-ray photon correlation spectroscopy (XPCS) to study the
relaxation dynamics of capillary waves on polymer films and Coherent
X-ray Diffraction (CXD) to study internal strain distribution of
zeolites. I will also review X-Ray reflectivity to probe the structure
at the surface and interfaces of multilayer systems such as those in
organic light emitting diode devices as well as the grazing incidence
small angle x-ray scattering (GISAXS) for studying structures of films
of different systems.
