(a-b) Variable Temperature Insert (VTI) System (1.2-300K, 7T); (c-e) Variable Temperature Probe Station (4-400K, 2.5T) with X-ray source; (f) Semiconductor Parameter Analyzer and 1GHz Oscilloscope.
(a-b) Variable Temperature Insert (VTI) System (1.2-300K, 7T);
(c-e) Variable Temperature Probe Station (4-400K, 2.5T) with X-ray source; (f) Semiconductor Parameter Analyzer and 1GHz Oscilloscope.
(c-e) Variable Temperature Probe Station (4-400K, 2.5T) with X-ray source;
(f) Semiconductor Parameter Analyzer and 1GHz Oscilloscope.
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