Author

Schaefer DM, Reifenberger R

Institution

Dept. of Phys., Purdue Univ., West Lafayette, IN, USA.

Editor

Sarikaya M; Wickramasinghe HK; Isaacson M.

Title

Nanoindentation on contamination-free gold films using the atomic force
microscopy.

Source

Determining Nanoscale Physical Properties of Materials by Microscopy and
Spectroscopy. Symposium. Mater. Res. Soc. 1994, pp.225-30. Pittsburgh, PA,
USA.

Conference Information

Determining Nanoscale Physical Properties of Materials by Microscopy and
Spectroscopy. Symposium. Boston, MA, USA. 29 Nov.-3 Dec. 1993.

Abstract

Nanoindentation experiments on high quality Au films were performed in vacuum using an atomic force microscope. In these experiments, elastic behavior was observed until loading forces greater than approximately 20 nN were applied. For loads larger than this, systematic changes in the jump-to-contact, loading/unloading and lift-off regions of the data occur. These observations are consistent with a transition from elastic to inelastic behavior during indentation. (17 References).