Author
Schaefer DM,
Carpenter M,
Reifenberger R,
DeMejo LP, and
Rimai DS.
Institution
Dept. of Phys., Purdue Univ., West Lafayette, IN, USA.
Title
Surface roughness and its influence on particle adhesion using atomic force
techniques.
Source
Journal of Adhesion Science & Technology, vol.9, no.8, 1995, pp.1049-62.
Netherlands.
Abstract
The surface force interactions between individual 8 mu m diameter spheres and
atomically flat substrates have been investigated using atomic force
techniques. The lift-off force of glass, polystyrene, and tin particles from
atomically smooth mica and highly oriented pyrolitic graphite substrates was
determined as a function of the applied loading force in an inert nitrogen
environment. While the relative magnitudes of the measured lift-off force
were found to scale as expected between the various systems studied, the
absolute values were a factor of approximately 50 smaller than expected from
the Johnson, Kendall, and Roberts theory. The surface topography of
representative spheres was characterized with atomic force microscopy,
allowing a quantitative assessment of the role that surface roughness plays
in the adhesion of micrometer-size particles to substrates. Taking into
account the radius of curvature of the asperities measured from the atomic
force scans, agreement between the measured and theoretical estimates for the
lift-off forces was improved, with the corrected experimental forces about a
factor of 3 smaller than theoretical expectations. (28 References).