Demejo LP, and
Dept. of Phys., Purdue Univ., W. Lafayette, IN, USA.
Surface force interactions between micrometer-size polystyrene spheres and
silicon substrates using atomic force techniques.
Journal of Adhesion Science & Technology, vol.8, no.3, 1994, pp.197-210.
The surface force interactions between a single micrometer-size polystyrene
sphere and a p-type silicon substrate were investigated using atomic force
microscope techniques. The force of removal and the degree of deformation of
the particle determined as a function of the applied loading force. The work
of removal, estimated assuming a perfectly spherical particle and a smooth
substrate, was also determined. The influence of surface contamination and
the implications of the short contact times used in these experiments are
discussed. (43 References).