Miller TG, McElfresh M, and Reifenberger R.
Dept. of Phys., Purdue Univ., West Lafayette, IN, USA.
Density-of-states fine structure in the tunneling conductance of Y-Ba-Cu-O films: a comparison between experiment and theory.
Physical Review B-Condensed Matter, vol.48, no.10, 1 Sept. 1993, pp.7499-7504. USA.
With improved signal-averaging techniques, the tunneling conductance from pulsed-laser-deposited films of YBa/sub 2/Cu/sub 3/O/sub 7- delta / reveals a rich fine structure in both the subgap and near-gap regions. A comparison of this structure with calculations by Tachiki et al. (1990) yields excellent agreement and indicates the origin of the fine structure is the density of electronic states on the different layered planes of this high-T/sub c/ material. (25 References).