Author

Miller S and. Reifenberger R.

Institution

Dept. of Phys., Purdue Univ., West Lafayette, IN, USA.

Title

Improved method for fractal analysis using scanning probe microscopy.

Source

Journal of Vacuum Science & Technology B, vol.10, no.3, May-June 1992, pp.1203-7. USA.

Abstract

The variation method of fractal analysis is used to determine the fractal dimension of a surface imaged with a scanning tunneling microscope. Using this technique, an estimate of the experimental uncertainty in the fractal dimension is obtained. The utility of this variation method is demonstrated by investigating the fractal behavior of a fractured carbon surface. (19 References).

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