Miller S and.
Dept. of Phys., Purdue Univ., West Lafayette, IN, USA.
Improved method for fractal analysis using scanning probe microscopy.
Journal of Vacuum Science & Technology B, vol.10, no.3, May-June 1992,
The variation method of fractal analysis is used to determine the fractal
dimension of a surface imaged with a scanning tunneling microscope. Using
this technique, an estimate of the experimental uncertainty in the fractal
dimension is obtained. The utility of this variation method is demonstrated
by investigating the fractal behavior of a fractured carbon surface. (19