P_2x5_175_A-1

Production testing

Date:4/27/2007

Operator: Cameron McKinney

start testing time:10:11 AM

Sensor: S_2x5_175, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W28_X54K5TT68C
ROC1W28_X54K5TT68A
ROC2W28_X54K5TT67D
ROC3W28_X54K5TT06D
ROC4W28_X54K5TT67A
ROC5W28_X54K5TT46A
ROC6W28_X54K5TT46B
ROC7W33_XC4K5LT15A
ROC8W28_X54K5TT47D
ROC9W28_X54K5TT06C

Depletion Voltage is -50 and suggested operational voltage is -90
Ibias_DAC, Ibias_DAC Data 130 122 126 118 128 124 112 120 120 122
Vana, VanaData 139 151 141 135 155 127 139 152 114 123
CalDelData and plots78908475778186778580
VthrCompData and plots80877582877379927784
TestDdata ,TestD Plots0001000000
LightData ,Light Plots0000000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe240240240240240235240240230240
Vsf175180175180195165200185160160
VoffsetOp85759080908070807080
VIbias_PH10510010011010595105100100105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 5.625347

SIGMA = 0.435676
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 5.595196

SIGMA = 0.426457
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.455001

SIGMA = 0.431353
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 6.183557

SIGMA = 0.471819
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.630552

SIGMA = 0.428359
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 5.336851

SIGMA = 0.421062
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 6.199997

SIGMA = 0.454872
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 5.147667

SIGMA = 0.402029
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 5.877173

SIGMA = 0.454698
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 5.631703

SIGMA = 0.438396

Comment (if any): Good.

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x5_175_A.html,

End testing time: 10:34 AM