P_2x5_132_A-3

Production testing

Date:6/5/2007

Operator: Emily Grace

start testing time:5:47 PM

Sensor: S_2x5_132, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0W45_D3LQFLT56A
ROC1W45_D3LQFLT55D
ROC2W45_D3LQFLT55C
ROC3W45_D3LQFLT55B
ROC4W45_D3LQFLT55A
ROC5W45_D3LQFLT37B
ROC6W45_D3LQFLT37C
ROC7W45_D3LQFLT38B
ROC8W45_D3LQFLT38C
ROC9W45_D3LQFLT38D

Depletion Voltage is -42 and suggested operational voltage is -82
Ibias_DAC, Ibias_DAC Data 152 156 154 148 158 146 158 150 150 164
Vana, VanaData 135 134 145 130 147 133 144 142 149 154
CalDelData and plots869774987910182989182
VthrCompData and plots90848682917690828692
TestDdata ,TestD Plots0300001400
LightData ,Light Plots0000000000
Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe100110951259585959510095
Vsf140140140140145145145150150145
VoffsetOp908585901109590110100110
VIbias_PH100105105100100951009595105
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.597474

SIGMA = 0.374579
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.634163

SIGMA = 0.374439
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 4.726576

SIGMA = 0.361901
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.521412

SIGMA = 0.354249
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 4.343676

SIGMA = 0.336130
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 4.429325

SIGMA = 0.346117
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 4.537542

SIGMA = 0.345390
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 4.071458

SIGMA = 0.322891
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 4.255461

SIGMA = 0.361735
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 3.940801

SIGMA = 0.293926

Comment (if any):

This Device have been tested 3Times prior to this one and here are the links to the previous tests:

P_2x5_132_A-1.html,

P_2x5_132_A-2.html,

P_2x5_132_A.html,

End testing time: 6:15 PM