P_2x5_077_C-2

Production testing

Date:4/13/2007

Operator: Gino Bolla

start testing time:11:27 AM

Sensor: S_2x5_077, Data for leakage current measurement , and plot on overall it is a GOOD sensor
ROCROC waferLabel
ROC0XW4KFXT41B
ROC1XW4KFXT48B
ROC2XW4KFXT45D
ROC3XW4KFXT45C
ROC4XW4KFXT43D
ROC5XW4KFXT33D
ROC6XW4KFXT34C
ROC7XW4KFXT34D
ROC8XW4KFXT35D
ROC9XW4KFXT36D

Depletion Voltage is -52 and suggested operational voltage is -92
Ibias_DAC, Ibias_DAC Data 128 136 132 134 138 134 124 136 140 142
Vana, VanaData 144 140 135 130 130 134 135 133 127 140
CalDelData and plots8977819382811028410292
VthrCompData and plots74847169736674716673
TestDdata ,TestD Plots4160416041604160416041604160416041604160
LightData ,Light Plots0100002110
Pass/Fail TestD BAD BAD BAD BAD BAD BAD BAD BAD BAD BAD
Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP

[IMAGE] of

Efficiency MAP

[IMAGE] of

EXTRA DACs for NOISE

VHldDe8510011012512510010013015080
Vsf140140140145145140140140140140
VoffsetOp95807575656590756095
VIbias_PH10010010010095100100105105100
ROC0 NOISE[IMAGE] of [IMAGE] of MEAN = 4.389907

SIGMA = 0.343507
ROC1 NOISE[IMAGE] of [IMAGE] of MEAN = 4.991874

SIGMA = 0.395643
ROC2 NOISE[IMAGE] of [IMAGE] of MEAN = 5.279159

SIGMA = 0.420134
ROC3 NOISE[IMAGE] of [IMAGE] of MEAN = 4.651550

SIGMA = 0.388035
ROC4 NOISE[IMAGE] of [IMAGE] of MEAN = 5.077570

SIGMA = 0.415904
ROC5 NOISE[IMAGE] of [IMAGE] of MEAN = 5.715023

SIGMA = 0.455575
ROC6 NOISE[IMAGE] of [IMAGE] of MEAN = 5.364221

SIGMA = 0.429812
ROC7 NOISE[IMAGE] of [IMAGE] of MEAN = 5.545712

SIGMA = 0.444323
ROC8 NOISE[IMAGE] of [IMAGE] of MEAN = 5.500195

SIGMA = 0.434356
ROC9 NOISE[IMAGE] of [IMAGE] of MEAN = 4.979757

SIGMA = 0.415584

Comment (if any): Still 4160 bad bumps on TestD.

This Device have been tested 2Times prior to this one and here are the links to the previous tests:

P_2x5_077_C-1.html,

P_2x5_077_C.html,

End testing time: 11:47 AM