P_2x3B_046

P_2x3B_046_A-1

Production testing

Date:5/25/2007

Operator: Emily Grace

start testing time:9:45 AM

Sensor: S_2x3B_04, Data for leakage current measurement , and plot on overall it is a GOOD sensor

ROC ROC wafer Label

ROC0 W36_XD4K3LT 06D

ROC1 W36_XD4K3LT 06C

ROC2 W36_XD4K3LT 06B

ROC3 W49_D1LQGST 06B

ROC4 W49_D1LQGST 06D

ROC5 W45_D3LQFLT 73A

ROC	ROC wafer	Label
ROC0	W36_XD4K3LT	06D
ROC1	W36_XD4K3LT	06C
ROC2	W36_XD4K3LT	06B
ROC3	W49_D1LQGST	06B
ROC4	W49_D1LQGST	06D
ROC5	W45_D3LQFLT	73A

Depletion Voltage is -40 and suggested operational voltage is -80

Ibias_DAC, Ibias_DAC Data 158 150 148 160 158 154

Vana, VanaData 137 131 122 143 172 149

CalDelData and plots 94 88 95 79 73 93

VthrCompData and plots 70 69 73 84 87 90

TestDdata ,TestD Plots 1 0 0 0 0 1

LightData ,Light Plots 0 0 0 0 0 0

Pass/Fail TestD GOOD GOOD GOOD GOOD GOOD GOOD

Pass/Fail LIGHT GOOD GOOD GOOD GOOD GOOD GOOD

Noise MAP at VMAX

Efficiency MAP

EXTRA DACs for NOISE

VHldDe	115	120	120	90	110	95
Vsf	140	140	135	140	160	150
VoffsetOp	80	75	70	100	110	95
VIbias_PH	105	100	100	95	95	105

ROC0 NOISE			MEAN = 4.360218 SIGMA = 0.345599
ROC1 NOISE			MEAN = 4.792597 SIGMA = 0.399145
ROC2 NOISE			MEAN = 4.915024 SIGMA = 0.389839
ROC3 NOISE			MEAN = 4.312251 SIGMA = 0.336796
ROC4 NOISE			MEAN = 4.229324 SIGMA = 0.325581
ROC5 NOISE			MEAN = 4.347107 SIGMA = 0.338995

Comment (if any):

This Device have been tested 1Times prior to this one and here are the links to the previous tests:

P_2x3B_046_A.html,

End testing time: 10:11 AM

Ibias_DAC, Ibias_DAC Data	158	150	148	160	158	154
Vana, VanaData	137	131	122	143	172	149
CalDelData and plots	94	88	95	79	73	93
VthrCompData and plots	70	69	73	84	87	90
TestDdata ,TestD Plots	1	0	0	0	0	1
LightData ,Light Plots	0	0	0	0	0	0
Pass/Fail TestD	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD
Pass/Fail LIGHT	GOOD	GOOD	GOOD	GOOD	GOOD	GOOD